ANSI/SCTE 45 2007
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The purpose of this test is to measure the group delay and group delay variation of a properly terminated device. This procedure is applicable to testing of 75 components.
- This product replaced by:ANSI/SCTE 45 2012 - Test Method for Group Delay
This product replaces:ANSI/SCTE 45 2002 - Test Method for Group Delay, (formerly IPS TP 211)
ANSI/SCTE 45 2012
ANSI/SCTE 45 2007
ANSI/SCTE 45 2002
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