BS DD ENV 50218:1996
BS DD ENV 50218:1996
Description of a parametrized European mini test chip
standard published 09/15/1996 by British Standards Institution
Full Description
Documents the parametrized MOS test structures of the device model Parameter extraction Test Chip (PTC) of the European Mini Test Chip (ETC).Cross References:
CENELEC R117-001
CENELEC R117-004
CENELEC R117-005
CENELEC R117-006
CENELEC R117-10
CENELEC prENV 50208-6
CENELEC ENV 50219
Cart
(empty)
New products
- API RP 1133
- API Spec 5B
- API RP 970
- API Spec 19OH
- API RP 934-E
- API MPMS Chapter 9.4
- API Std 2015
- API MPMS Chapter 7.4
- API RP 578
- API MPMS Chapter 12.1 Part 2
- API RP 1145
- API MPMS Chapter 14.7 (R2023)
- API TR 977
- API Std 662 Datasheets
- API Std 976
- API Spec 5L
- API Std 20L
- API TR 980
- API MPMS Chapter 3.1B
- API MPMS Chapter 3.1B (R2016)
- API Bull E3
- API MPMS Chapter 13.2
- API RP 17Q (R2023)
- API MPMS Chapter 7.2 (R2023)
- API RP 5C6
- Specials
- New products
- Top sellers
- Contact us
- About us
- Powered by documentweb.org™
