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BS EN 62276:2013

Standard Number
BS EN 62276:2013
Title
Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Status
Current
Publication Date
28 February 2013
Cross References
EN 60758:2009, IEC 60410:1973, IEC 60758:2008, IEC 60862-1, IEC 60862-2, IEC 60862-3, IEC 61019-1, IEC 61019-2, IEC 61019-3, ISO 4287:1997, ANSI/IEEE Std 176:1987, ASTM F533
Replaces
BS EN 62276:2005

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Descriptors
Piezoelectric devices, Dielectric devices, Electromechanical filters, Crystal resonators, Crystals (electronic), Quartz, Substrates (insulating), Acoustic waves, Acoustic filters, Acoustoelectric devices, Electrical wave measurement, Acoustic measurement
Title in French
Tranches monocristallines pour applications utilisant des dispositifs ondes acoustiques de surface (OAS). Spcifications et mthodes de mesure
Title in German
Einkristall-Wafer fr Oberflchenwellen-(OFW-)Bauelemente. Festlegungen und Messverfahren
Pages
44
File Size
1.597 MB
Price
162.00

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