BS EN 62047-18:2013

Standard Number
BS EN 62047-18:2013
Title
Semiconductor devices. Micro-electromechanical devicesBend testing methods of thin film materials
Status
Current
Publication Date
31 October 2013
Cross References
IEC 62047-6:2009, EN 62047-6:2010

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Descriptors
Semiconductor devices, Electronic equipment and components, Electromechanical devices, Semiconductor technology, Integrated circuits, Thin-film devices, Fatigue testing, Bend testing, Resonance, Vibration, Test specimens, Test equipment
Title in French
Dispositifs semiconducteurs. Dispositif microlectromcaniques. Mthodes d’essai de flexion des matriaux en couche mince
Title in German
Halbleiterbauelemente. Bauelemente der Mikrosystemtechnik. Biegeprfverfahren fr Dnnschichtwerkstoffe
Pages
18
File Size
1.275 MB
Price
100.00