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BS ISO 11938:2012

Standard Number
BS ISO 11938:2012
Title
Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
Status
Current
Publication Date
30 April 2013
Cross References
ISO 5725-6, ISO 14594, ISO 16592:2006, ISO/IEC 17025:2005, ISO 17470, ISO 22489, ISO 23833

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Descriptors
Semiconductors, Detectors, X-ray fluorescence spectrometry, Spectroscopy, Semiconductor diodes, Electron beams, Chemical analysis and testing
Title in French
Analyse par microfaisceaux. Analyse par microsonde lectronique (microsonde de Castaing). Mthodes d’analyse par cartographie lmentaire en utilisant la spectromtrie dispersion de longueur d’onde
Pages
22
File Size
1.8 MB
Price
100.00

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