Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
Status
Current
Publication Date
31 August 2012
Cross References
ISO 23833, ISO/IEC 17025, ISO 22309, ASTM E1508, ISO 18115-1, IEC 60759, ANSI/IEEE 759
Semiconductors, Detectors, X-ray fluorescence spectrometry, Spectroscopy, Semiconductor diodes, Electron beams, Chemical analysis and testing
Title in French
Analyse par microfaisceaux. Paramtres de performance instrumentale slectionns pour la spcification et le contrle des spectromtres X slection d’nergie utiliss en microanalyse par sonde lectrons