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BS EN 60749-27:2006+A1:2012

Standard Number
BS EN 60749-27:2006+A1:2012
Title
Semiconductor devices. Mechanical and climatic test methodsElectrostatic discharge (ESD) sensitivity testing. Machine model (MM)
Status
Current
Publication Date
29 September 2006
Cross References
IEC 61340-3-2, IEC 60749-26, EN 61340-3-2:2002, EN 60749-26:2006
Replaces
BS EN 60749:1999, IEC 60749:1996

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Descriptors
Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Electrostatics, Sensitivity, Classification systems, Grades (quality), Electrical testing, Damage, Degradation, Test models
Title in French
Dispositifs a semiconducteurs. Methodes dessais mecaniques et climatiques. Essai de sensibilite aux decharges electrostatiques (DES). Modele de machine (MM)
Title in German
Halbleiterbauelemente. Mechanische und klimatische Pruefverfahren. Pruefung der Empfindlichkeit gegen elektrostatische Entladungen (ESD). Machine Model (MM)
Pages
16
File Size
619.3 KB
Price
100.00

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