BS EN 15991:2011

Standard Number
BS EN 15991:2011
Title
Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)
Status
Current
Publication Date
28 February 2011
Cross References
Regulation (EC) No. 2037/2000, ISO 5022:1979, ISO 8656-1:1988, EN ISO 21068-1:2008, ISO 21068-1:2008, ISO 5725-2:1994, ISO/IEC Guide 98-3, GUM:1995, ISO 5725-4:1994

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Descriptors
Ceramics, Raw materials, Refractory materials, Silicon inorganic compounds, Carbides, Particulate materials, Chemical analysis and testing, Determination of content, Impurities, Trace element analysis, Emission spectrophotometry, Vaporization
Title in French
Essais sur matriaux cramiques et basiques. Dtermination directe des fractions massiques dimpurets dans les poudres et les granuls de carbure de silicium par spectroscopie dmission optique plasma induit par haute frquence (ICP OES) avec vaporisation lectrothermique (ETV)
Title in German
Prfung keramischer Roh- und Werkstoffe. Direkte Bestimmung der Massenanteile von Spurenverunreinigungen in pulver- und kornfrmigem Siliciumcarbid mittels optischer Emissionsspektrometrie mit induktiv gekoppeltem Plasma (ICP OES) und elektrothermischer Verdampfung (ETV)
Pages
32
File Size
1.271 MB
Price
140.00