BS EN 60749-30:2005+A1:2011

Standard Number
BS EN 60749-30:2005+A1:2011
Title
Semiconductor devices. Mechanical and climatic test methodsPreconditioning of non-hermetic surface mount devices prior to reliability testing
Status
Current
Publication Date
27 January 2006
Cross References
IEC 60749-4, IEC 60749-5, IEC 60749-11, IEC 60749-20:2008, IEC 60749-24, IEC 60749-25:2003, IEC 60749-33, EN 60749-4:2002, EN 60749-5:2003, EN 60749-11:2002, EN 60749-20:2009, EN 60749-24:2004, EN 60749-25:2003, EN 60749-33:2004

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Descriptors
Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Surface mounting devices, Specimen preparation, Reliability, Performance testing
Title in French
Dispositifs semiconducteurs. Mthodes dessais mcaniques et climatiques. Prconditionnement des composants pour montage en surface non hermtiques avant les essais de fiabilit
Title in German
Halbleiterbauelemente. Mechanische und klimatische Prfverfahren. Behandlung nicht hermetisch verkappter oberflchenmontierbarer Bauelemente vor Zuverlssigkeitsprfungen
Pages
18
File Size
1.164 MB
Price
100.00