Descriptors
Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Overvoltage tests, Overvoltage, Electrical faults, Electrical impedance, Electrical testing, Destructive testing, Failure rate
Title in French
Dispositifs semiconducteurs. Mthodes dessai mcaniques et climatiques. Essai de verrouillage
Title in German
Halbleiterbauelemente. Mechanische und klimatische Prfverfahren. Latch-up-Prfung
Pages
26
File Size
1.333 MB
Price
140.00