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BS EN 62418:2010

Standard Number
BS EN 62418:2010
Title
Semiconductor devices. Metallization stress void test
Status
Current
Publication Date
31 August 2010

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Descriptors
Semiconductor devices, Semiconductors, Electronic equipment and components, Stress, Surfaces, Metals, Diffusion, Aluminium, Copper, Electrical measurement, Visual inspection (testing)
Title in French
Dispositifs semi-conducteurs. Essai sur les cavits dues aux contraintes de la mtallisation
Title in German
Halbleiterbauelemente. Prfverfahren zur Metallisierungs-Stressmigration
Pages
20
File Size
1.338 MB
Price
100.00

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