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BS EN 60749-15:2010

Standard Number
BS EN 60749-15:2010
Title
Semiconductor devices. Mechanical and climatic test methodsResistance to soldering temperature for through-hole mounted devices
Status
Current
Publication Date
28 February 2011
Cross References
IEC 60068-2-20, EN 60068-2-20
Replaces
BS EN 60749-15:2003

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Descriptors
Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Encapsulated, Soldering, Solderability testing, Thermal testing, Holes, Slots, Destructive testing
Title in French
Dispositifs semiconducteurs. Mthodes dessai mcaniques et climatiques. Rsistance la temprature de soudage pour dispositifs par trous traversants
Title in German
Halbleiterbauelemente. Mechanische und klimatische Prfverfahren. Bestndigkeit gegen Lttemperatur bei Bauelementen zur Durchsteckmontage
Pages
10
File Size
1.071 MB
Price
82.00

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