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BS ISO 22493:2008

Standard Number
BS ISO 22493:2008
Title
Microbeam analysis. Scanning electron microscopy. Vocabulary
Status
Current
Publication Date
31 October 2008
Cross References
ISO 704, ISO 1087-1, ISO 10241, ISO 18115:2001, ISO 23833

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Descriptors
Scanning electron microscopes, Electron microscopes, Microscopes, Electron beams, Electron optics, Optical instruments, Vocabulary, Terminology, Instrumental methods of analysis
Title in French
Analyse par microfaisceaux. Microscopie lectronique balayage. Vocabulaire
Title in German
Mikrobereichsanalyse. Rasterelektronenmikroskopie. Vokabular
Pages
34
File Size
385.3 KB
Price
162.00

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