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BS EN 60749-37:2008

Standard Number
BS EN 60749-37:2008
Title
Semiconductor devices. Mechanical and climatic test methodsBoard level drop test method using an accelerometer
Status
Current
Publication Date
30 May 2008
Cross References
IEC 60749-10:2002, IEC 60749-20, IEC 60749-20-1, EN 60749-10:2002, EN 60749-20:2003, IEC 60749-40
Replaces
DD IEC/PAS 62050:2004

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Descriptors
Semiconductor devices, Integrated circuits, Electronic equipment and components, Printed-circuit boards, Surface mounting devices, Drop tests, Mechanical testing, Impact testing, Accelerated testing, Environmental testing
Title in French
Dispositifs semiconducteurs. Mthodes dessais mcaniques et climatiques. Mthode dessai de chute au niveau de la carte avec utilisation dun acclromtre
Title in German
Halbleiterbauelemente. Mechanische und klimatische Prfverfahren. Prfverfahren Fall der Leiterplatte unter Verwendung eines Beschleunigungs-Messgertes
Pages
22
File Size
802.8 KB
Price
100.00

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