Descriptors
Semiconductors, Semiconductor devices, Dielectric breakdown, Life (durability), Films (states of matter), Electrical measurement, Testing conditions, Mathematical calculations
Title in French
Dispositifs semiconductors. Essai de rupture dilectrique en fonction du temps (TDDB) pour films dilectriques de grille
Title in German
Halbleiterbauelemente. Prfung des zeitabhngigen dielektrischen Durchbruchs (TDDB) fr dielektrische Gate-Schichten
Pages
24
File Size
1.583 MB
Price
140.00