Descriptors
Metal oxide semiconductors, Semiconductors, Transistors, Semiconductor devices, Electronic equipment and components, Voltage measurement, Testing conditions, Temperature
Title in French
Essai de stabilite de temperature en polarisation pour transistors a effet de champ metal-oxyde-semiconducteur (MOSFET)
Title in German
Stabilitaetspruefung unter Temperatur-Spannungs-Beanspruchung fuer Feldeffekttransistoren mit Metalloxid-Halbleiter (MOSFET)
Pages
16
File Size
1.682 MB
Price
100.00