Viewed products

Home>AS ISO 14606-2006

AS ISO 14606-2006

AS ISO 14606-2006 Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials

standard by Standards Australia, 01/01/2006

More details

Download

PDF AVAILABLE FORMATS IMMEDIATE DOWNLOAD
$34.55

$78.53

(price reduced by 56 %)

Full Description

Adopts ISO 14606:2000 to give guidance on the optimization of sputter depth profiling parameters using appropriate single-layered and multi-layered reference materials in order to achieve optimum depth resolution as a function of instrument settings.

Product Details

Published: 01/01/2006File Size: 1 file , 350 KB

Contact us